Modelling, Methods, and Technology SIG

The focus of the MMT SIG is on the basics needed to establish and maintain correct and reliable reference data. For more on the mandate, see the MMT SIG homepage at the POSC Caesar main website.

Ongoing activities

• We have begun publishing documentation on ISO 15926 templates, as developed in the IDS-ADI project. Templates are patterns for facts for which definitions are stated in terms of rules. This provides for a convenient and precise interface, and is intended to be used for creating and maintaining ontologies that conform to the ISO 15926 standard.

Template Development

Templates may be used to define and represent both reference data and project data. The following figure illustrates the relations between the languages of ISO 15926 Parts 2/4 and the template language of Part 7. In brief: Part 2 corresponds to a Description Logic (DL) TBox, i.e., classes and relations. Part 4 and other reference data populate the Part 2 structure with individual instances, a DL ABox. Templates according to Part 7 require a much more expressive, first-order language.

• TemplateGenerics gives an informal account of what goes into the definition of a template.
• TemplateCharacterization descibes the methodology by which data sets are characterized in terms of templates
• TemplateStartingSet documents the "starting set" of templates
• TemplateMinimumSubSet identifies a minimum subset of the "starting set" for population of the WIP with new content

Look at the bottom of this page, and of TemplateDescriptionID, for ongoing discussion on the characterization of ISO 15926 templates. A document describing the current list of templates defined in the IDS project, with roles and brief definitions in natural language, can be found as an attachment to the Intelligent Data Sets Prototype page.

The following is a list of pages that describe individual templates, with definitions, diagrams, and so forth.

• TemplateDescriptionID Now with discussion forum
• TemplateDescriptionIDC
• TemplateDescriptionIP
• TemplateDescriptionIPC
• TemplateDescriptionCIPcSQQ

Tools in this Trac

ISO 15926 Diagrams.

The Wiki provides for entering diagrams of ISO 15926 models, using a simplified set of xy-pic commands; see ISO15926Diagrams. Examples can be found in ISO15926Diagrams_BoltSet, ISO15926Diagrams_Weights.

Complex content using LaTeX.

This Trac supports entering content in LaTeX format, using the LatexEquation plugin. This is useful for entering first-order formulae, and diagrams.

Macros for fetching reference data.

A facility for dynamically pulling content from the Reference Data Library for graphical display on Trac pages, using XSLT, graphviz, and the macrochain macro, is high on our wishlist. For the time being, only the XSLT macro works with Trac 0.11.

Source material

Presentations

Presentations from Semantic Days 2008 are available in Powerpoint format. We intend to provide PDF formatted copies shortly.

• A Tutorial on semantic technology, with special focus on templates for ISO 15926. Download slides
• A presentation of SIG MMT, describing this Trac and the need for template interfaces for creating reference data. Download slides

Links

• The 15926-2 standard in OWL (non-authoritative). If you wish to work with this to create data, consider Protege 3.4 beta (note: build 126 or later) or 4.0 alpha. To open the ontology in the OwlSight ontology browser, click here.

• The 15926-2 standard in EXPRESS (authoritative), with documentation in HTML

• Under development, an overview of ISO 15926 reference data resources contains a series of resources (files and links) related to Models, Methods and Technology for ISO 15926. Please note that access to these resources currently requires logging in, that display requires Internet Explorer, and that some of the links are limited to internal DNV use for the time being.

• Take note: A new paper called Structured Objects in OWL (Motik, Cuenca Grau, Sattler) is extremely promising with regard to finding a more natural and powerful language for defining templates. Stay tuned.

Contact: Johan W. Klüwer, johan.wilhelm.kluewer@….

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